A, B, C, D, E, F, G, H, I, J, K, L, M, N, O, P, Q, R, S, T, U, V, W, X, Y, Z,
| A, | |
| Abbreviations; Index of | [1], |
| Absolute temperature | [1], |
| Absorption coefficient | [1], |
| Acceptors | [1], |
| Accumulation | [1], |
| Accumulation; in heterojunctions | [1], |
| Advanced | [1], |
| Affinity | [1], |
| Aluminothermic process for Si production | [1], |
| Amphoteric doping | [1], |
| Anisotropic dissolution | [1], |
| Annealing of defects | [1], |
| Annealing; after ion implantation | [1], |
| Approximations; free electron gas | [1], |
| Area density | [1], |
| Area emitting LED | [1], |
| Arrhenius plot | [1], |
| Auger recombination | [1], [2], [3], |
| Avalanche breakdown | [1], |
| Axial modes | [1], |
| B, | |
| Backbone I module | [1], |
| Backbone II module | [1], |
| Ballistic carriers | [1], |
| Band bending | [1], |
| Band gaps | [1], |
| Band-band recombination channel | [1], |
| Base of a crystal | [1], |
| Base of bipolar transistor | [1], |
| Base transit time | [1], |
| Basics modules | [1], |
| Bayer Solar | [1], |
| Beer's law | [1], |
| Bell laboratories; the most famours research labs in the world around 1960 | [1], |
| Beweglichkeit; Definition | [1], |
| Bipolar transistor | [1], |
| Black body radiation | [1], |
| Black box; for p-n junctions | [1], |
| Blakeslee | [1], |
| Bloch theorem | [1], |
| Bloch wave | [1], |
| Blue LEDs | [1], |
| Bold script for index words | [1], |
| Bose-Einstein distribution | [1], |
| Bound exciton | [1], |
| Boundary conditions; for free electron gas | [1], |
| Bragg condition | [1], |
| Bravais lattices | [1], |
| Brillouin construction | [1], |
| Brillouin zones | [1], |
| Buffer layer | [1], |
| Built-in potential | [1], |
| Bulk microdefects | [1], |
| Burgers vector | [1], [2], |
| Burrus type LED | [1], |
| C, | |
| Capacitance of a SCR | [1], |
| Capacitance of SCR | [1], [2], |
| Capture cross section | [1], |
| Carborundum | [1], |
| Carrier statistics | [1], |
| Casting of Silicon | [1], |
| Cathodoluminescence | [1], |
| CELLO technique | [1], |
| Chemical force | [1], |
| Chemical potential | [1], |
| Chemoluminescence | [1], |
| Cis configuration | [1], |
| Collector | [1], |
| Columns in module matirx | [1], |
| Compliant substrates | [1], |
| Conducting Polymers | [1], |
| Conductivity | [1], [2], [3], |
| Conjugated polymer | [1], [2], |
| Conservation of crystal momentum | [1], |
| Conservation of particles/charge | [1], |
| Constant Potential | [1], |
| Contamination | [1], |
| Continuity assumption | [1], |
| Continuity equation | [1], [2], |
| Crystal momentum | [1], [2], [3], |
| Crystal momentum conservation | [1], |
| Crystal originated particles or pits | [1], |
| Current density | [1], |
| Current efficiency of light generation | [1], |
| Current-voltage characteristics of a p-n-junction | [1], |
| D, | |
| Dangling bonds | [1], |
| de Broglie equation | [1], |
| Debye lenght | [1], |
| Debye length | [1], [2], |
| Debye temperature | [1], |
| Deep levels | [1], |
| Deep states | [1], |
| Defect etches | [1], |
| Density of electrons; basic formula | [1], |
| Density of States | [1], [2], |
| Depletion | [1], [2], |
| Device size considerations | [1], |
| Device speed | [1], |
| Diamond; as heat sink | [1], |
| Dictionary English - German | [1], |
| Dielectric relaxation time | [1], [2], |
| Differential gain factor | [1], |
| Diffusion capacitance | [1], [2], |
| Diffusion coefficent | [1], |
| Diffusion coefficients of carriers | [1], [2], |
| Diffusion current in p-n junction | [1], |
| Diffusion current; electrical | [1], |
| Diffusion length | [1], [2], [3], |
| Diffusion profile | [1], |
| Diode equation | [1], [2], |
| Diode type heterojunction | [1], |
| Direct dissolution | [1], |
| Direct semiconductors | [1], |
| Directional solidification | [1], |
| Discontinuity; in the band diagram | [1], |
| Dislocations in Si | [1], |
| Dispersion function | [1], |
| Distribution function | [1], |
| Donors | [1], |
| Dopant activation | [1], |
| Doping | [1], [2], |
| Doping, of SiC | [1], |
| Dose | [1], |
| Double hetero junction | [1], |
| Drift current in a p-n junction | [1], |
| Drift velocity | [1], [2], [3], |
| Drift velocity; of fly swarm | [1], |
| Driftgeschwindigkeit | [1], |
| Ductility of Si; at high temperatures | [1], |
| Dynamic carrier equilibrium | [1], |
| Dynamic equilibrium | [1], |
| E, | |
| Ecercises | [1], |
| Edge emitting LED | [1], [2], |
| Effctive mass | [1], |
| Effective density of states | [1], [2], |
| EFG solar Si | [1], |
| Einstein | [1], |
| Einstein coefficient for stimulated absorption | [1], [2], |
| Einstein relation | [1], [2], |
| Einstein-Smoluchowski relations | [1], |
| Elastic scatteirng | [1], |
| Electrical diffusion current | [1], |
| Electroluminescence | [1], |
| Electrons in semiconductors | [1], |
| Emission probability for electrons | [1], [2], |
| Emitter of a bipolar transistor | [1], |
| Emitter-push effect | [1], |
| Energy gap | [1], |
| Energy splitting; at the BZ | [1], |
| Ensemble average | [1], |
| Enthalpy | [1], |
| Entropy | [1], |
| Entropy of recombination/generation | [1], |
| Equilibrium condition | [1], |
| Equipartition theorem | [1], |
| Equivalent circuit diagram | [1], |
| Ergodic hypothesis | [1], |
| Errorfunction | [1], |
| Esaki | [1], |
| Etching | [1], |
| Ewald construction | [1], |
| Exciton | [1], [2], |
| Excitons | [1], |
| External efficiency | [1], |
| External efficiency of light generation | [1], |
| F, | |
| Fabry-Perot resonator | [1], |
| Feldstärke; statt Spannung | [1], |
| Fermi energy | [1], |
| Fermis golden rule | [1], |
| Ficks laws | [1], [2], |
| Field current in a p-n junction | [1], |
| Field strength | [1], |
| First Laser condition | [1], |
| Flat band | [1], |
| Fliegenschwarmanalogie | [1], |
| Fluorescence | [1], |
| Format Hyperscript | [1], |
| Forward current in a p-n junction | [1], |
| Fourier transform of lattice | [1], [2], |
| Free electron gas | [1], |
| free electron gas model | [1], [2], |
| Free energy | [1], |
| Free enthalpy | [1], |
| Frequency range of LEDs | [1], |
| Fresnel laws | [1], |
| Fundamental absorption | [1], [2], |
| G, | |
| Gain coefficient | [1], [2], |
| Gain driven Laser | [1], |
| Gauss | [1], |
| Gauss law | [1], |
| Generation current in a p-n junction | [1], |
| Generation currents from the SCR | [1], [2], [3], |
| Generation life time | [1], [2], |
| Generation rate | [1], [2], |
| Generation rate in direct semiconductors | [1], |
| Generation rate; by photons | [1], |
| Gibbs energy | [1], |
| Gold; in Si | [1], |
| Grain boundaries in Si | [1], |
| Group velocity | [1], [2], [3], |
| H, | |
| Hamilton operator | [1], |
| Heterojunctions | [1], |
| Heterostructures | [1], |
| High injection | [1], |
| High injection approximation | [1], |
| High injection case | [1], |
| Holes in semiconductors | [1], |
| Hydrogen passivation | [1], |
| Hyperscript; format of | [1], |
| I, | |
| Illustration modules | [1], |
| Imref | [1], |
| Index driven Laser | [1], |
| Index grading | [1], |
| Index of abbreviations | [1], |
| Index of key words | [1], |
| Index of names | [1], |
| Index of refraction; of semiconductors | [1], |
| Indirect semiconductors | [1], |
| Injection luminescence | [1], |
| Injection ratio | [1], |
| Intensity of light | [1], |
| Interface charge | [1], |
| Interface chemistry | [1], |
| Interface energy | [1], |
| Interface states | [1], [2], |
| Interface structure | [1], |
| Interface, electronic properties | [1], |
| Interface, structural properties | [1], |
| Internal energy | [1], |
| Intrinsic conductivity of Silicon | [1], |
| Intrinsic loss coefficient | [1], |
| Intrinsic Semiconductors | [1], [2], |
| Inversion | [1], [2], [3], |
| Ion implantation | [1], |
| Ionized dopants | [1], |
| Isoelectronic doping | [1], |
| Isotropic dissolution | [1], |
| Isotype heterojunction | [1], |
| Isotype junctions | [1], |
| J, | |
| Junctions; simple | [1], |
| K, | |
| Key word index | [1], |
| Kick-out diffusion mechanism | [1], |
| L, | |
| Large signal response. | [1], |
| Laser | [1], [2], |
| Laser condition | [1], |
| Lattice misfit | [1], |
| Life time | [1], [2], [3], |
| Life time; formula for the | [1], |
| Light bulbs; replacement | [1], |
| Local equilibrium | [1], |
| Localized excitons | [1], |
| Localized light scattering defect | [1], [2], |
| Longitudional modes | [1], |
| Luminescence | [1], |
| M, | |
| Majority carriers | [1], |
| Maser | [1], |
| Mass action law | [1], [2], [3], |
| Matrix of modules | [1], |
| Maxwell equations | [1], |
| Mean free path | [1], |
| Mean scattering time | [1], |
| Melting point anomaly of Si | [1], |
| Metallurgical junction | [1], |
| metamaterial | [1], |
| Micro electronic and mechanical systems | [1], |
| Micro systems | [1], |
| Micropipes; in SiC | [1], |
| Miller indices | [1], |
| Minority carrier life itme | [1], [2], [3], |
| Minority carriers | [1], |
| Misfit dislocations | [1], |
| Mobility | [1], [2], [3], |
| Mobility of carriers | [1], |
| Mobility of electrons; in Si | [1], |
| Modes of Lasers | [1], |
| Modulation doping | [1], |
| Module matrix | [1], |
| Modules of solar cells | [1], |
| Moissanite (= natural SiC) | [1], |
| Monomode Laser | [1], |
| Motorola | [1], [2], |
| Multi quantum well | [1], |
| Multiple quantum well | [1], |
| N, | |
| n-type semiconductor | [1], [2], |
| Names: Indiex of | [1], |
| Net generation of carriers | [1], |
| Newtons Laws | [1], |
| O, | |
| Ohmic contacts | [1], |
| Ohmic resistor | [1], |
| Ohms law | [1], |
| Optica lefficiency of light generation | [1], |
| Optical properties, of SiC | [1], |
| Optoelectronics defined | [1], |
| Optoelectronics; and SiC | [1], |
| P, | |
| p-n-junction | [1], |
| Parts per quatrillion | [1], |
| Passivation | [1], |
| Passivation | [1], |
| Pauli exclusion principle | [1], |
| Peierls | [1], [2], |
| Peierls instability | [1], [2], [3], |
| Peierls instability and superconductivity | [1], [2], |
| Peierls transition | [1], |
| Perfect semiconductors | [1], |
| Periodic boundary conditions; for the free electron gas | [1], |
| Phase noise; in Lasers | [1], |
| Phase space | [1], |
| Phase velocity | [1], [2], |
| Phonons | [1], [2], |
| Phonons; and interaction with electrons | [1], |
| Phosphorescence | [1], |
| Photoluminescence | [1], |
| Photonic crystals | [1], |
| Physical vapor transport; for SiC crystal growth | [1], |
| PIN diode | [1], |
| Piss; for etching Si | [1], |
| Plasma | [1], |
| Point defects in Si | [1], |
| Poisson equation | [1], [2], |
| Polymorphism | [1], |
| Polytypes; of SiC | [1], |
| Potential; for free electron gas | [1], |
| Proecipitates in Si | [1], |
| Pumping a Laser | [1], |
| Pure diffusion currents | [1], |
| Pythagoras | [1], |
| Q, | |
| Quantum efficiency of light generation | [1], [2], |
| Quantum numbers; in the free electron gas model | [1], |
| Quantum state | [1], |
| Quantum theory | [1], |
| Quantum well | [1], |
| Quantum wells | [1], |
| Quasi Fermi energies | [1], |
| Quasi Fermi energy | [1], |
| Quasi wave vector | [1], |
| Quasi-particles | [1], |
| R, | |
| Radiation resistance; of SiC devices | [1], |
| Radiative channels | [1], |
| Ramsdell notation; for SiC polytypes | [1], |
| Rapid thermal processing | [1], [2], |
| Reciprocal lattice | [1], [2], |
| Recombination channels | [1], [2], |
| Recombination coefficient | [1], |
| Recombination current | [1], |
| Recombination currrent in a p-n junction | [1], |
| Recombination life time | [1], |
| Recombination rate | [1], [2], |
| Recombination rate; in non-equilibrium | [1], |
| Recombination volume | [1], |
| Recombination zone | [1], [2], [3], |
| Reduced band diagrams | [1], |
| Refractive index of semiconductors | [1], |
| Replacing light bulbs | [1], |
| Resistivity | [1], |
| Reverse current in a p-n junction | [1], |
| reverse current; in diodes | [1], |
| Rows in module matrix | [1], |
| Ruby | [1], |
| S, | |
| Saturated electron drift velocity | [1], |
| Scaling factor | [1], |
| Scaling laws | [1], |
| Scattering | [1], |
| Scattering cross section | [1], [2], |
| Scattering mechanisms | [1], |
| Schroedinger equation | [1], |
| Schrödinger equation | [1], |
| Second Laser condition | [1], |
| Secondary mass spectroscopy | [1], |
| Selective etching | [1], |
| Series resistance | [1], |
| Shallow levels | [1], |
| Shockley-Read-Hall recombination | [1], [2], |
| Shunt resistance | [1], |
| SiC | [1], |
| SiC, doping of | [1], |
| SiC, electronic properties | [1], |
| SiC; optical properties | [1], |
| Single quantum well | [1], [2], |
| Sintering of Si | [1], |
| Small diodes | [1], |
| Small signal response | [1], |
| Smoluchowski | [1], |
| Snellius law | [1], |
| Solar cell | [1], |
| Solar cell market | [1], |
| Solar cells | [1], [2], |
| Solar grade Si | [1], |
| Solubility limit | [1], |
| Solubility; dopants in Si | [1], |
| Space charge layer | [1], |
| Space charge region | [1], |
| Specific conductance | [1], |
| Specific heat of Si | [1], |
| Specific resistance | [1], |
| Spherical solar cells from TI | [1], |
| Spin | [1], |
| Spin; of the electron | [1], [2], |
| Spintronic | [1], |
| Spontaneous emission of a photon | [1], [2], |
| State; Quantum state | [1], |
| Steady state (and non-equilibrium) | [1], |
| Stimulated Emission | [1], |
| Stimulated emission of a photon | [1], |
| Stored charge | [1], |
| Stromdichte; statt Strom | [1], |
| Strong inversion | [1], |
| Superradiant LEDs | [1], |
| Surface concentration; calculation from volume concentration | [1], |
| Surface density | [1], |
| Surface emitting LEDs | [1], |
| Surface generation velocity | [1], |
| Surface recombination velocity | [1], |
| Surface states | [1], |
| Switching behavior (of a diode) | [1], |
| Symmetry breaking; in polymer conductivity | [1], |
| T, | |
| Table of Contents | [1], |
| Thermal conductivity of Si | [1], |
| Thermal expansion coefficient of Si | [1], |
| Thermalization | [1], |
| Thermodynamic potentials | [1], |
| Thin film solar cells | [1], |
| Three level system | [1], |
| Threshold density | [1], |
| Threshold value for lasing ; gain coefficient | [1], [2], |
| top | [1], |
| Total energy (in Schroedinger equation) | [1], |
| Trans configuration# | [1], |
| Transients (in current) | [1], |
| Transients (in voltage) | [1], |
| Transit time | [1], |
| Transition rates | [1], |
| Transparency density | [1], |
| Transverse modes | [1], |
| Tunnel diodes | [1], |
| U, | |
| Ulterviolet catastrophe | [1], |
| Uncertainty relaltion; for Lasers | [1], |
| V, | |
| Varactors | [1], |
| von Karman | [1], |
| W, | |
| Wacker Siltronic | [1], [2], |
| Warpage | [1], |
| Wave function | [1], |
| Wave length of free electron | [1], |
| Wave vector | [1], [2], [3], |
| Weak inversion | [1], |
| Width of base region; parameter or speed | [1], |
| Wigner-Seitz cells | [1], |
| Wire saws | [1], |
| Workfunction | [1], |
| Working point | [1], |
| X,Y, | |
| Yield stress | [1], |
© H. Föll (Semiconductors - Script)