A, B, C, D, E, F, G, H, I, J, K, L, M, N, O, P, Q, R, S, T, U, V, W, X, Y, Z,
A, | |
abbr. | Abbreviation |
B,C, | |
CAU | Christian-Albrechts_Universität zu Kiel |
D, | |
DRAM | Dynamic Random Access Memory |
E, | |
EFG | Edge defined Film-fed (crystal) Growth |
EFG | Edge-defined Film fed Growth |
EFG) | Edge-Defined, Film-Fed Growth |
EBIC | Electron-beam induced |
F, | |
FZ | Float zone |
FZ | Float zone |
FZ | Float-Zone |
G,H, | |
HRTEM | hHgh-revolution TEM |
HRTEM | High resolution TEM |
HVTEMI | High-Voltage TEM |
HVTEM | High-Voltage TEM |
HVTEM | High-Voltage Transmission Electron Microscope |
I, | |
ITO | Indium tin oxide |
(IC | Integrated circuit |
J,K,L,M, | |
Max-Planck Institut | Max-Planck Inst |
MP | Max-Planck-Institut |
MPI | max-Planck-Institute |
MB | Megabyte |
N,O,P, | |
PSST | Porous semiconductors science and technology |
PSL | Porous Si Layer |
Q,R,S, | |
SEM | Scanning electron microscopy |
SEM | Scanning electron microscope |
Cello | solar CELl LOcal characterization |
CELLO | solar CELl LOcal characterization |
S-Web | Supported web |
S-web | Suspended Web |
T, | |
TF | Technische Fakultät der CAU zu Kiel |
TEM | Transmission Electron Microscope |
U,V, | |
VIN | Vorlesung im Netz |
© H. Föll (Archive H. Föll)