|
Pictures to: 2.3 Swirl Defects in Si (Investigated in a HVTEM)
Part 3 |
|
|
|
|
 |
Months after I thought I was done with archiving the swirl work, I found another
file full of pictures not yet selected. Here is a small number of these finds. |
| |
|
 |
First, a few optical pictures showing the swirl pattern on our 33 mm FZ crystals. The pulling speed is also indicated. |
|
|
|
| Probably <100> oriented |
|
|
|
|
| Probably 111 >oriented |
|
|
|
|
| At the lowest growth speed dislocations were generated |
|
|
|
 |
One more example to specimens preparation |
| |
|
|
Top: 2.3 mm diamter specimen, though-light view Bottom: Looking at the surface |
|
|
|
|
|
Huge defect shown at two different diffraction conditions. Here, as in other examples, the very
long and straight dislocations dipoles are decorated by second order agglomerates. |
|
|
| A rather weird assembly
Of course, the major part of this defect might have been etched out by specimen preparation, witness the etch pits. |
|
|
|
Complex defect shown at two different diffraction conditions. A simple unfaulted loop seems
to be at the heart of the defect.. |
|
|
|
|
| Complex defect shown at two different diffraction conditions. . |
|
|
|
 |
Here are the links to the rest |
| |
|
|
|
|
| |
|
With frame

2.3 Swirl Defects in Si (Investigated in a HVTEM)
Pictures to: 2.3 Swirl Defects in Si (Investigated in a HVTEM; Part 1
Pictures to: 2.3 Swirl Defects in Si (Investigated in a HVTEM; Part 2
© H. Föll (Archive H. Föll)