Pictures to: 3.1 TEM Work at Cornell University

 

3.1.1. TEM Investigations of Grain Boundaries in Silicon

 

Part 2: Fig. 9 - Fig. 16 plus some Auxiliaries

In what follows I present the pictures used for the one and only major publication concerned with the structure of the grain boundaries. Besides the originals, I give some auxiliary pictures that show essentially the same structure.
You are going miss Fig. 8 ? Sorry - I have no good print of that picture anymore.
     
 
Grain boundaries in Si; first HRTEM
Fig. 9 in publication.
(111) lattice fringes across two low-angle boundaries on (100) planes. Tlted-beam illumination and a specimen orientation close to a (112) pole was used for this and the following lattice-fringe images. The spacing between the fringes is 0.31nm.
I fondly belie that this is the very first high-resolution TEM (HRTEM) picture of screw dislocations. It shows directly the typical drawings shown in text books
 
Grain boundaries in Si; first HRTEM
Detail rto Fig. 9
 
Grain boundaries in Si; first HRTEM
Detail to Fig. 9
 
Grain boundaries in Si
Fig. 10 in publication.
 
Grain boundaries in Si
Relating to Fig. 10.
Showing contrast change from intrinsic to extrinsic stacking
fault upon changing the sign of the diffraction vector
 
Grain boundaries in Si
. Relating to Fig. 10 in publication; as above
 
Grain boundaries in Si
Auxiliary picture to Fig. 10.
Increasing the excitation error in weak beam increases resolution but decreases contrast.
It also needs longer exposure times and thus increases the risque of blurring
 
Grain boundaries in Si
Fig. 11 in publication.
Weak-beam and lattice-fringe image of a low-angle twist boundary on a (111) plane.
 
Grain boundaries in Si
Detail to Fig. 11.
 
Grain boundaries in Si
Fig. 12a in publication.
Low-angle twist boundary on a (111) plane imaged with two different sets of (111) lattice fringes.
 
Grain boundaries in Si
Fig. 12b in publication.
 
Grain boundaries in Si
Relating to Fig. 11 / 12 in publication to Fig. 6 in publication.
 
Grain boundaries in Si
Fig. 13 in publication.
 
Grain boundaries in Si
Similar to Fig. 13.
 
Grain boundaries in Si; HRTEM
Fig. 14 in publication.
 
Grain boundaries 
in Si; HRTEM
Other view of part of Fig. 14.
 
Grain boundaries in Si; HRTEM
Part of Fig. 14.
 
Grain boundaries in Si
Close to Fig. 15 in publication.
Low-angle twist boundary on a (111) plane imaged with g=(224) exhibiting the structure of 8 twin boundary in the right-hand side
 
Grain boundaries in Si; HRTEM
Fig. 16 in publication.
Direct lattice image of a low-angle twist boundary on a {llI} plane with an additional tilt component split into twin boundary
 
Grain boundaries in Si; HRTEM
Fig. 16b once more.
 
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