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Pictures to: 3.1 TEM Work at Cornell University |
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3.1.1. TEM Investigations of Grain Boundaries in Silicon |
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Part 2: Fig. 9 - Fig. 16 plus some Auxiliaries |
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In what follows I present the pictures used for the one and only major publication concerned with the structure of the grain boundaries. Besides the originals, I give some auxiliary pictures that show essentially
the same structure. |
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You are going miss Fig. 8 ? Sorry - I have no good print of that picture anymore. |
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Fig. 9 in publication. (111) lattice fringes across two low-angle boundaries on (100) planes.
Tlted-beam illumination and a specimen orientation close to a (112) pole was used for this and the following lattice-fringe
images. The spacing between the fringes is 0.31nm. |
I fondly belie that this is the very first high-resolution TEM (HRTEM) picture of screw dislocations. It shows directly the typical
drawings shown in text books |
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| Detail rto Fig. 9 |
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| Detail to Fig. 9 |
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Fig. 10 in publication. |
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Relating to Fig. 10. Showing contrast change from intrinsic to extrinsic stacking fault
upon changing the sign of the diffraction vector |
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| . Relating to Fig. 10 in publication; as above |
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Auxiliary picture to Fig. 10. Increasing the excitation error in weak beam increases resolution
but decreases contrast. It also needs longer exposure times and thus increases the risque of blurring |
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| Fig. 11 in publication. |
Weak-beam and lattice-fringe image of a low-angle twist boundary on a (111) plane. |
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| Detail to Fig. 11. |
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| Fig. 12a in publication. |
Low-angle twist boundary on a (111) plane imaged with two different sets of (111) lattice fringes. |
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| Fig. 12b in publication. |
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| Relating to Fig. 11 / 12 in publication to Fig. 6 in publication. |
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| Fig. 13 in publication. |
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| Similar to Fig. 13. |
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| Fig. 14 in publication. |
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| Other view of part of Fig. 14. |
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| Part of Fig. 14. |
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| Close to Fig. 15 in publication. |
Low-angle twist boundary on a (111) plane imaged with g=(224) exhibiting the structure of 8 twin boundary
in the right-hand side |
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| Fig. 16 in publication. |
Direct lattice image of a low-angle twist boundary on a {llI} plane with an additional tilt component split
into twin boundary |
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| Fig. 16b once more. |
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With frame

3.1 TEM Work at Cornell University; 3.1 TEM Investigations of Grain Boundaries in Silicon
Pictures to: 3. TEM Work at Cornell University; 3.1.1. TEM Investigations of Grain Boudnaries in Silicon
Pictures to: 3.1 TEM Work at Cornell University; 3.1.1. TEM Investigations of Grain Boundaries in Silicon
© H. Föll (Archive H. Föll)