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Pictures to: 3.1 TEM Work at Cornell University |
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3.1.1. TEM Investigations of Grain Boundaries in Silicon |
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Part 3: Auxiliary Pictures |
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Pictures will follow that were not included in the paper. |
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| Comparison Bright Field - Weak Beam
Just shows that it was not so easy to see the structures clearly. |
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HRTEM image of small-angle tilt boundary in Si. Similar to Fig. 15 in publication. This may
not have been the very first HRTEM of a small angle boundary but it was definitely among the first ones. |
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Grain boundary decoupled from amorphous regions? The GB is on the left and a parallel-running
amorphous region (SiO2?) nearby. |
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With frame

3.1 TEM Work at Cornell University; 3.1 TEM Investigations of Grain Boundaries in Silicon
Pictures to: 3. TEM Work at Cornell University; 3.1.1. TEM Investigations of Grain Boudnaries in Silicon
Pictures to: 3.1 TEM Work at Cornell University; 3.1.1. TEM Investigations of Grain Boundaries in Silicon
Pictures to: 3.1 TEM Work at Cornell University; 3.1.1. TEM Investigations of Grain Boundaries in Silicon
Pictures to: 3.2.1 Double Ribbons and the Stacking Fault Energes in Si
© H. Föll (Archive H. Föll)