3.1 TEM Work at Cornell University

3.1 TEM Investigations of Grain Boundaries in Silicon

3.1.1 Background

3.1.2 Publications

3.1.3 Pictures

3.2 Double Ribbons and Stacking Fault Energies in Si

3.2.1 Background

3.2.2 Publications

3.2.3 Pictures

3.3 Defects in EFG Si Ribbons

3.3.1 Background

3.3.2 Publications

3.3.3 Pictures

3.4 Weak Beam Contrast of Stacking Faults in TEM

3.4.1 Background

3.4.2 Publications

3.4.3 Pictures

© H. Föll (Archive H. Föll)