Pictures to: Kristallfehler in hochintegrierten Schaltkreisen aus Silizium    Part 2
 

(Crystal Lattice Defects in Highly Integrated Silicon Devices)
In what follows you see the second part of the "Abbildungen" (Pictures) as they occur in the report. The scans were made from my still existing copy and some of the pictures were somewhat processed by me to improve clarity.
The figure captions are included so there is no need for further text.
Here we have Fig. 23 - Fig. 45
     
 
Defects in IC
 
Defects in IC
 
Defects in IC
 
Defects in IC
 
Defects in IC
 
Defects in IC
 
Defects in IC
 
{Defects in IC
 
Defects in IC
 
Defects in IC
 
Defects in IC
 
Defects in IC
 
Defects in IC
 

Continue with Fig. 45 - 71

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go to 2.4 Process Induced Defects in Si Chips (Investigated in a HVTEM)

go to Kristallfehler in hochintegrierten Schaltkreisen aus Silizium

go to Pictures to: Kristallfehler in hochintegrierten Schaltkreisen aus Silizium   Part 1

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© H. Föll (Archive H. Föll)