Structuring means selective removal of material (through a mask) by etching. There are three main conditions for etching: |
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1. Must attack material to be etched Þ etching rate. | |||||
2. Must not attack everything else Þ selectivity. | |||||
3. Must conserve structure of mask (good on left side of picture, not so good on right side). | |||||
Chemical etching: |
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Can be near perfect for points 1. and 2.. Example: HF attacks only SiO2 but not Si and most other materials. | |||||
Fails miserably on point 3. | |||||
Underetching is unavoidable. Can't be used for lateral structure sizes < » 2 µm | |||||
Plasma etching ("Dry" etching) |
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In a plasma quite unusual reactions can take place - including reactions never seen in normal chemistry. Many materials can be etched in a suitable plasma | |||||
Etching might preserve the lateral mask dimensions - for reasons not always entirely clear | |||||
There is tremendous potential in plasma etching because of the tremendously large parameter space - and tremendous problems and costs for the same reasons | |||||
Allmost all "small" structures in semiconductor technology are obtained by plasma etching |
© H. Föll (Semiconductor Technology - Script)