6.4.4 Summary to: 6.4 Etching Techniques

Structuring means selective removal of material (through a mask) by etching. There are three main conditions for etching:
Contact hole etching
1. Must attack material to be etched Þ etching rate.
2. Must not attack everything else Þ selectivity.  
3. Must conserve structure of mask (good on left side of picture, not so good on right side).  
 
Chemical etching:  
Chemical underetching
Can be near perfect for points 1. and 2.. Example: HF attacks only SiO2 but not Si and most other materials.  
Fails miserably on point 3.  
Underetching is unavoidable. Can't be used for lateral structure sizes < » 2 µm
         
Plasma etching ("Dry" etching)  
Basic plasma etching
In a plasma quite unusual reactions can take place - including reactions never seen in normal chemistry. Many materials can be etched in a suitable plasma  
Etching might preserve the lateral mask dimensions - for reasons not always entirely clear  
There is tremendous potential in plasma etching because of the tremendously large parameter space - and tremendous problems and costs for the same reasons  
Allmost all "small" structures in semiconductor technology are obtained by plasma etching  

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© H. Föll (Semiconductor Technology - Script)