|
Again, we start from the equation for the net recombination UDL via
deep levels |
| |
UDL = |
v · s
e · NDL · (ne · nh – ni2) |
ne + nh + 2n i · |
cosh | EDL – EMB
kT |
| = |
ne + nh + 2ni · | cosh
| EDL – EMB kT |
|
|
|
|
|
with 1/t = v ·s
e ·NDL as we know by now. |
|
| |
|
The carrier densities ne and n h
may be expressed via their Quasi-Fermi energies as
E Fe and EFh
, respectively. For their product we get |
| |
ne · nh | =
| ni2 · exp – |
EFe – EFh
kT |
|
|
|
For the forward direction we have EFe – E
Fh < 1 and thus |
| |
|
|
|
This leaves us with |
| |
UDL | = |
1 t |
· |
ne · nh
ne + nh |
|
|
|
The maximum value for U DL gives
the upper limit for the net recombination rate and thus the maximum current due to recombination
in the SRC, too. The maximum is defined by |
|
|
¶{(ne · nh)/( ne + nh)}
¶ne |
= |
¶{(ne · nh)/(ne
+ nh)}
¶nh |
= 0 |
|
|
|
|
which gives us ne = nh for maximum current. With ne
· nh = ni 2 · exp – [(EFe –
EFh )/k T] from above, we have |
|
|
ne = nh |
= | ni · exp – |
E
Fe – EFh 2kT |
|
|
|
What we need now is an equation for the difference of the Quasi-Fermi energies. Lets look at
the situation in a band-diagram |
| |
|
|
|
Whatever the exact positions of the Quasi-Fermi energies, their difference E Fe
– EFh is about equal to the difference in the
bulk Fermi energy and thus |
| |
|
|
|
(The "about equal" contains roughly the same approximation
as the "average barrier height" from the simple derivation!) |
|
This gives us the final result |
|
|
UDL (max) |
» |
1 2t |
· ni · exp – |
e · U 2kT |
|
|
|
Again , this is the net recombination rate at any point in the space
charge region. To obtain the current density, we have to multiply with the width d of the SCR (and
the elementary charge) and obtain for the maximum current from the SCR in forward direction: |
| |
jF(SRC) | = |
e · ni · dSCR
2t |
· exp – |
e · U 2kT |
|
|
|
Considering that we needed the whole formalism of Shockley-Read-Hall recombination theory,
Quasi-Fermi energies, some junction theory, and lots of assumptions and approximations to
get the same result as before, this does not appear to be a much better way of getting an idea about the influence of
the SCR on the diode characteristic than the "quick and dirty" way. |
| |
But don't deceive yourself! The treatment given here is not only physically sound, but transparent at every
step. If you want to do more precise calculations, you would know - at least in principle - what to do. |
| | |
© H. Föll (Semiconductors - Script)