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Two more pictures from D. Appel and
his group from the research center GKSS in Geesthacht. |
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The first one shows a medium magnification bright field picture of TiAl, just showing
a lot of boundaries, stacking faults and dislocations |
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Not the parallel arrangement of some dislocations, which run right through the sample and move on the same
glide plane, probably coming from some active source in the boundary. |
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The following pictures shows a time sequence of the same part of the specimen after successive annealing
treatments. The changes in the dislocation structure (some pointed out by arrows) are due to climb processes. |
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© H. Föll (Defects - Script)