Two more pictures from D. Appel and his group from the research center GKSS in Geesthacht. | |||
The first one shows a medium magnification bright field picture of TiAl, just showing a lot of boundaries, stacking faults and dislocations | |||
Not the parallel arrangement of some dislocations, which run right through the sample and move on the same glide plane, probably coming from some active source in the boundary. | |||
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The following pictures shows a time sequence of the same part of the specimen after successive annealing treatments. The changes in the dislocation structure (some pointed out by arrows) are due to climb processes. | |||
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6.3.3 Stacking Faults and Other Defects
© H. Föll (Defects - Script)