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Shown is a preferentially etched part of an integrated circuit. Many kinds of defects are revealed; the interpretation is not necesarily clear. | ||
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The big etch pits in the frames of device parts are due to dislocations. | ||
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In the structureless area we see pits and hillocks (distinguished because the "black-white vector", the vector from the black part of a small contrast to the white part comes with both signs) and a few very distinctive features consisting of a central pit with "satellites" along one direction. | ||
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All these features are most likely due to precipitates. The rows of pits are caused by precipitates that produced a sequence of dislocation loops to relieve the stress in a process known as "prismatic punching". | ||
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What prismatic punching looks like if imaged with a transmission electron microscope at high magnfication can be seen in the link | ||
6.1.1 Observation of Dislocations and Other Defects
© H. Föll (Defects - Script)