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It is possible after the
predictions of the current burst model to form macropores on high doped
silicon |
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Mesopores are growing with a lack of an anodic oxide into the
substrate. Mesopores are growing on high doped n- and p-type silicon. An
example of mesopores on high doped n-type silicon (0.020-0.060
Wcm) - see SEM-micrograph below. |
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According to this "current-burst-model", macropores
form if the balance between direct dissolution and oxidation in a current burst
is within a certain bandwidth, and mesopores, generally observed on highly
doped p- and n-Si, are observed if the oxidation component is too small.
Accordingly, an enhancement of the oxidizing power of an electrolyte, should
have the potential to produce macropores under conditions where otherwise only
mesopores occur. Strong oxidizing compontes were added to the electrolyte. The
macorpores were etched in the dark n-Si: (0.020-0.060 Wcm). |
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The pore tips shows {111}-planes. |
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The nucleation of the macropores takes place at (111)-pyramids
forming in a generally rough surface. |
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No backside illumination could be used because the small
diffusion length of highly doped Si would prevent the hole diffusion to the
front side. The holes needed thus must be generated by electric field effects
(avalanche break-through) which is easy in highly doped materials. But
avalanche break-through so far has been considered to be prime the effect for
mesopore generation and thus should not be seen as a prime reason for macropore
formation. According to the current burst model, the prime reason for macropore
formation in this (and other) cases is the decreased probability for current
bursts on H-passivated surfaces coupled with the smoothing action provided by a
minimum of oxidation following direct dissolution, and this accounts at least
qualitatively for the experimental observations. Other factors, as, e.g., the
shape of the space charge region (SCR), or the supply of holes may influence
macropore stability, too, by influencing the nucleation probability of current
bursts, but the interplay between H-passivation and oxidation must be seen as
the prime parameters. |
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For detail informations see:
CHRISTOPHERSEN, M., CARSTENSEN, J., FÖLL, H., Macropore-formation on
highly doped n-type silicon, PSST 2000, Madrid , March 2000. (to be published
in Phys. Stat. Sol. (a)) |
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