Necking

	Here is an X-ray topograph of the first part of crystal growth
		An X-ray topograph is similar to a transmission electron micorscope image - it shows the interior of the sample and dislocations are visible as dark lines.
		Courtesy of Wacker / Siltronic; Burghausen, Germany

With frame

6.1.2 Silicon Crystal Growth

© H. Föll (Electronic Materials - Script)