4. IBM T.J. Watson Research Center

4.1 TEM of Silicon - Silicide Interfaces

4.1.1 Some General Remarks

4.1.2 Silicon - Silicide Interfaces

4.1.3 Publications

4.1.4 Pictures

4.2 TEM of Defects Produced by Ion Implantation

4.2.1 Introduction

4.2.1 Publications

4.2.3 Pictures

4.3. Anodic Defect Etching

4.3.1 Introduction

4.3.2 Publications

4.3.3 Pictures

With frame Back Forward

© H. Föll (Archive H. Föll)