Pictures to: Siemens Report 2: Crystal Lattice Defects in Integrated Silicon Devices, in particular with respect to very large integration (VLSI) | ||
Link to text of report 2 | ||
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In what follows you find the pictures to the second report | |
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I will provide no text for pictures that are contained in the report and/or publication. Look it up there. | |
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Kristallfehler in hochintegrierten Schaltkreisen aus Silizium
© H. Föll (Archive H. Föll)