|   |  
 
  | Desired Property |  
Materials not meeting requirement |  
   | Very good conductivity |  
All but Ag, Cu |     
High eutectic temperature with Si  (> 800 oC would be good) |  
Au, Pd, Al, Mg |     
| Low diffusivity in Si |  Cu, Ni, Li |  
   | Low oxidation rate; stable oxide |  
Refr. Metals, Mg, Fe, Cu, Ag |     
| High melting point |  Al, Mg, Cu |     
| Minimal interaction with Si substrate |  
Pt, Pd, Rh, V, Ni , Mo, Cr (form silicides easily) |     
| Minimal interaction with poly Si  |  
Same as above |     
| No interaction with SiO2 |  
Hf, Zr, Ti, Ta, Nb, V. Mg, Al |     
| But must stick well to SiO2 |  ? |  
   | Must also comply with other substrates, e.g. TiN |  
? (see example for Al) |  
   | Chemical stability, especially in HF environments |  
Fe, Co, Ni, Cu, Mg, Al |     
| Easy structuring |  Pt, Pd, Ni, Co, Au |    
 | Electromigration resistant |  Al, Cu |  
   | .... and many more,... |     |    
 
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